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Equivalent Model of the DC Resistance of Nonwoven-Based Embroidery Conductive Lines with Embroidery Parameters

Research and development

Authors:

  • Zhang Yaya
    Key Lab of Textile Science & Technology, Ministry of Edycation, Dong Hua University, Shanghai, P. R. China
  • Hu Jiyong
    Laboratory of Textile Science & Technology, Ministry of Education, Dong Hua University, Shanghai, P. R. China
  • Yan Xiong (j/w)

Nr DOI: 10.5604/01.3001.0013.7312

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Abstract:

Although embroidering technology is generally used to manufacture electronic components, previous works only give the fitting relationship between embroidery parameters and their direct current (DC) resistance. However, to manufacture embroidered electronic components in scale, the relationship between their DC resistance and embroidery parameters must be known in the computer aided embroidery system. This study investigated the effect of embroidery parameters, including stitch spacing, stitch length and embroidery tension, on the DC resistance of embroidery conductive lines using a peripheral needle, and established their equivalent resistance model in terms of the properties of conductive yarns and embroidery parameters. To verify the model, conductive lines with different embroidery parameters were embroidered on polyester nonwoven, and their DC resistance were tested and fitted. The results show that DC resistance can be effectively controlled by adjusting embroidery parameters. The model proposed is verified and can be used to predict the DC resistance of conductive lines with predesigned parameters.

Tags:

textiles, conductive line, embroidery parameters, direct current resistance.

Citation:

Zhang Y, Hu J, Yan X. Equivalent Model of the DC Resistance of Nonwoven-Based Embroidery Conductive Lines with Embroidery Parameters. FIBRES & TEXTILES in Eastern Europe  2020; 28, 2(140): 35-42. DOI: 10.5604/01.3001.0013.7312

Published in issue no 2 (140) / 2020, pages 35–42.

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